Semiconductor storage devices-Testing
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ShareCopied to clipboardSemiconductor storage devices-Testing is a book subject. It includes 4 books, written by 4 different authors.
Key facts
- number of authors: 4 people
- number of books: 4
- books: Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits, High performance memory testing : design principles, fault modeling, and self-test, Multi-run memory tests for pattern sensitive faults
- authors: Michael L. Bushnell, R. Dean Adams, Ireneusz Mrozek
- publication dates: 2000, 2003, 2019
- book publishers: Kluwer Academic, : Springer
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"Semiconductor storage devices-Testing" is one of the 293,135 book subjects in our database.
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