Metal oxide semiconductors, Complementary-Reliability
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ShareCopied to clipboardMetal oxide semiconductors, Complementary-Reliability is a book subject. It includes 4 books, written by 4 different authors.
Key facts
- number of authors: 4 people
- number of books: 4
- books: Latchup in CMOS technology : the problem and its cure, Reliability of high mobility SiGe channel MOSFETs for future CMOS applications, Testing and reliable design of CMOS circuits
- authors: Ronald R. Troutman, Jacopo Franco, Niraj K. Jha
- publication dates: 1986, 2014, 1990
- book publishers: Kluwer Academic, : Springer
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"Metal oxide semiconductors, Complementary-Reliability" is one of the 293,135 book subjects in our database.
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