Metal oxide semiconductors, Complementary-Defects
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ShareCopied to clipboardMetal oxide semiconductors, Complementary-Defects is a book subject. It includes 4 books, written by 3 different authors.
Key facts
- number of authors: 3 people
- number of books: 4
- books: Defect oriented testing for CMOS analog and digital circuits, Defect-oriented testing for nano-metric CMOS VLSI circuits, Latchup in CMOS technology : the problem and its cure
- authors: Manoj Sachdev, Ronald R. Troutman
- publication dates: 1998, 2011, 1986
- book publishers: Kluwer Academic, : Springer
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"Metal oxide semiconductors, Complementary-Defects" is one of the 293,135 book subjects in our database.
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