Integrated circuits-Wafer-scale integration
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ShareCopied to clipboardIntegrated circuits-Wafer-scale integration is a book subject. It includes 3 books, written by 3 different authors.
Key facts
- number of authors: 3 people
- number of books: 3
- books: Fault-tolerance through reconfiguration of VLSI and WSI arrays, Feature profile evolution in plasma processing using on-wafer monitoring system, Wafer-level testing and test during burn-in for integrated circuits
- authors: R. Negrini, Seiji Samukawa, Sudarshan Bahukudumbi
- publication dates: 1989, 2014, 2010
- book publishers: MIT Press, : Springer, Artech House
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"Integrated circuits-Wafer-scale integration" is one of the 293,135 book subjects in our database.
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