Integrated circuits-Very large scale integration-Testing-Data processing
ShareCopied to clipboardIntegrated circuits-Very large scale integration-Testing-Data processing is a book subject. It includes 6 books, written by 5 different authors.
Key facts
- number of authors: 5 people
- number of books: 6
- books: An artificial intelligence approach to test generation, Digital hardware testing : transistor-level fault modeling and testing, Formal methods in circuit design
- authors: Narinder Singh, Rochit Rajsuman, Victoria Stavridou
- publication dates: 1987, 1992, 1993
- book publishers: Kluwer, Artech House, Cambridge University Press
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"Integrated circuits-Very large scale integration-Testing-Data processing" is one of the 293,135 book subjects in our database.
This dashboard is based on data from: The British Library.
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