Integrated circuits-Very large scale integration-Testing
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ShareCopied to clipboardIntegrated circuits-Very large scale integration-Testing is a book subject. It includes 22 books, written by 21 different authors.
Key facts
- number of authors: 21 people
- number of books: 22
- books: Built-in test for VLSI : pseudorandom techniques, Debug automation from pre-silicon to post-silicon, Defect-oriented testing for nano-metric CMOS VLSI circuits
- authors: Paul H. Bardell, Mahdī Dihbāshī, Manoj Sachdev
- publication dates: 1987, 2014, 2011
- book publishers: Wiley, : Springer
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"Integrated circuits-Very large scale integration-Testing" is one of the 293,135 book subjects in our database.
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