Integrated circuits-Very large scale integration-Defects
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ShareCopied to clipboardIntegrated circuits-Very large scale integration-Defects is a book subject. It includes 3 books, written by 3 different authors.
Key facts
- number of authors: 3 people
- number of books: 3
- books: Defect-oriented testing for nano-metric CMOS VLSI circuits, From contamination to defects, faults and yield loss : simulation and applications, Test and diagnosis for small-delay defects
- authors: Manoj Sachdev, Jitendra B. Khare, Mohammad H. Tehranipoor
- publication dates: 2011, 1996, 2011
- book publishers: : Springer, Kluwer Academic
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"Integrated circuits-Very large scale integration-Defects" is one of the 293,135 book subjects in our database.
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