Integrated circuits-Fault tolerance
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ShareCopied to clipboardIntegrated circuits-Fault tolerance is a book subject. It includes 8 books, written by 7 different authors.
Key facts
- number of authors: 7 people
- number of books: 8
- books: Assessing fault model and test quality, Digital circuit testing and testability, Fault-tolerance and reliability techniques for high-density random-access memories
- authors: Kenneth M. Butler, Parag K. Lala, Kanad Chakraborty
- publication dates: 1992, 1997, 2002
- book publishers: Kluwer Academic Publishers, Academic Press, Prentice-Hall
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"Integrated circuits-Fault tolerance" is one of the 293,135 book subjects in our database.
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