Digital integrated circuits-Testing
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ShareCopied to clipboardDigital integrated circuits-Testing is a book subject. It includes 17 books, written by 15 different authors.
Key facts
- number of authors: 15 people
- number of books: 17
- books: A unified approach for timing verification and delay fault testing, Assessing fault model and test quality, Defect oriented testing for CMOS analog and digital circuits
- authors: Mukund Sivaraman, Kenneth M. Butler, Manoj Sachdev
- publication dates: 1998, 1992, 1998
- book publishers: Kluwer Academic, Kluwer Academic Publishers
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"Digital integrated circuits-Testing" is one of the 293,135 book subjects in our database.
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