Wafer-level testing and test during burn-in for integrated circuits
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ShareCopied to clipboardWafer-level testing and test during burn-in for integrated circuits is a book. It was written by Sudarshan Bahukudumbi and published by Artech House in 2010.
Key facts
- author: Sudarshan Bahukudumbi
- publication date: 2010
- book publisher: Artech House
- book series: Artech House integrated microsystems series
- book subjects: Integrated circuits-Testing, Integrated circuits-Wafer-scale integration, Semiconductors-Testing
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"Wafer-level testing and test during burn-in for integrated circuits" is one of the books by Sudarshan Bahukudumbi, books by Artech House and 2,617,384 books in our database.
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