Reliability of high mobility SiGe channel MOSFETs for future CMOS applications
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ShareCopied to clipboardReliability of high mobility SiGe channel MOSFETs for future CMOS applications is a book. It was written by Jacopo Franco and published by : Springer in 2014.
Key facts
- author: Jacopo Franco
- publication date: 2014
- book publisher: : Springer
- book series: Springer series in advanced microelectronics
- book subjects: Metal oxide semiconductors, Complementary-Reliability
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"Reliability of high mobility SiGe channel MOSFETs for future CMOS applications" is one of the books by Jacopo Franco, books by : Springer and 2,617,384 books in our database.
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