Nanometer variation-tolerant SRAM statistical design for yield
ShareCopied to clipboardNanometer variation-tolerant SRAM statistical design for yield is a book. It was written by Mohamed H. Abu-Rahma and published by : Springer in 2013.
Key facts
- author: Mohamed H. Abu-Rahma
- publication date: 2013
- book publisher: : Springer
- book series: unknown
- book subjects: Integrated circuits-Design and construction, Random access memory, Nanoelectromechanical systems-Design and construction
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"Nanometer variation-tolerant SRAM statistical design for yield" is one of the books by Mohamed H. Abu-Rahma, books by : Springer and 2,617,384 books in our database.
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