Metal impurities in silicon- and germanium-based technologies : origin, characterization, control, and device impact
ShareCopied to clipboardMetal impurities in silicon- and germanium-based technologies : origin, characterization, control, and device impact is a book. It was written by Cor L. Claeys and published by : Springer in 2018.
Key facts
- author: Cor L. Claeys
- publication date: 2018
- book publisher: : Springer
- book series: Springer series in materials science
- book subjects: Materials science, Surfaces (Physics), Microwaves
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"Metal impurities in silicon- and germanium-based technologies : origin, characterization, control, and device impact" is one of the books by Cor L. Claeys, books by : Springer and 2,617,384 books in our database.
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