High performance memory testing : design principles, fault modeling, and self-test
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ShareCopied to clipboardHigh performance memory testing : design principles, fault modeling, and self-test is a book. It was written by R. Dean Adams and published by Kluwer Academic in 2003.
Key facts
- author: R. Dean Adams
- publication date: 2003
- book publisher: Kluwer Academic
- book series: Frontiers in electronic testing
- book subjects: Semiconductor storage devices-Testing
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"High performance memory testing : design principles, fault modeling, and self-test" is one of the books by R. Dean Adams, books by Kluwer Academic and 2,617,384 books in our database.
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