From contamination to defects, faults and yield loss : simulation and applications
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ShareCopied to clipboardFrom contamination to defects, faults and yield loss : simulation and applications is a book. It was written by Jitendra B. Khare and published by Kluwer Academic in 1996.
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- author: Jitendra B. Khare
- publication date: 1996
- book publisher: Kluwer Academic
- book series: Frontiers in electronic testing
- book subjects: Computer-aided design, Integrated circuits-Very large scale integration-Testing, Integrated circuits-Very large scale integration-Computer simulation
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"From contamination to defects, faults and yield loss : simulation and applications" is one of the books by Jitendra B. Khare, books by Kluwer Academic and 2,617,384 books in our database.
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