Defect-oriented testing for nano-metric CMOS VLSI circuits
ShareCopied to clipboardDefect-oriented testing for nano-metric CMOS VLSI circuits is a book. It was written by Manoj Sachdev and published by : Springer in 2011.
Key facts
- author: Manoj Sachdev
- publication date: 2011
- book publisher: : Springer
- book series: Frontiers in electronic testing
- book subjects: Integrated circuits-Very large scale integration-Testing, Metal oxide semiconductors, Complementary-Defects, Integrated circuits-Very large scale integration-Defects
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"Defect-oriented testing for nano-metric CMOS VLSI circuits" is one of the books by Manoj Sachdev, books by : Springer and 2,617,384 books in our database.
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