Defect oriented testing for CMOS analog and digital circuits
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ShareCopied to clipboardDefect oriented testing for CMOS analog and digital circuits is a book. It was written by Manoj Sachdev and published by Kluwer Academic in 1998.
Key facts
- author: Manoj Sachdev
- publication date: 1998
- book publisher: Kluwer Academic
- book series: Frontiers in electronic testing
- book subjects: Digital integrated circuits-Testing, Metal oxide semiconductors, Complementary-Defects, Metal oxide semiconductors, Complementary-Testing
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"Defect oriented testing for CMOS analog and digital circuits" is one of the books by Manoj Sachdev, books by Kluwer Academic and 2,617,384 books in our database.
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