Data mining and diagnosing IC fails
ShareCopied to clipboardData mining and diagnosing IC fails is a book. It was written by Leendert M. Huisman and published by : Springer in 2005.
Key facts
- author: Leendert M. Huisman
- publication date: 2005
- book publisher: : Springer
- book series: Frontiers in electronic testing
- book subjects: Data mining, Semiconductors-Failures
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"Data mining and diagnosing IC fails" is one of the books by Leendert M. Huisman, books by : Springer and 2,617,384 books in our database.
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