CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
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ShareCopied to clipboardCMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test is a book. It was written by Andrei Pavlov and published by : Springer in 2008.
Key facts
- author: Andrei Pavlov
- publication date: 2008
- book publisher: : Springer
- book series: Frontiers in electronic testing
- book subjects: Random access memory, Nanoelectronics, Metal oxide semiconductors, Complementary-Design
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"CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test" is one of the books by Andrei Pavlov, books by : Springer and 2,617,384 books in our database.
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