Built-in test for VLSI : pseudorandom techniques
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ShareCopied to clipboardBuilt-in test for VLSI : pseudorandom techniques is a book. It was written by Paul H. Bardell and published by Wiley in 1987.
Key facts
- author: Paul H. Bardell
- publication date: 1987
- book publisher: Wiley
- book series: unknown
- book subjects: Integrated circuits-Very large scale integration-Testing
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"Built-in test for VLSI : pseudorandom techniques" is one of the books by Paul H. Bardell, books by Wiley and 2,617,384 books in our database.
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