An artificial intelligence approach to test generation
ShareCopied to clipboardAn artificial intelligence approach to test generation is a book. It was written by Narinder Singh and published by Kluwer in 1987.
Key facts
- author: Narinder Singh
- publication date: 1987
- book publisher: Kluwer
- book series: The Kluwer international series in engineering and computer science : Knowledge representation, learning, and expert systems
- book subjects: Artificial intelligence, Expert systems (Computer science), Integrated circuits-Very large scale integration-Testing-Data processing
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"An artificial intelligence approach to test generation" is one of the books by Narinder Singh, books by Kluwer and 2,617,384 books in our database.
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