Multi-run memory tests for pattern sensitive faults
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Key facts
- Author: Ireneusz Mrozek
- Isbn: 3319912046
- Bnb id: GBB8K0032
- Language: eng
- Publication date: 2019
- book publisher: : Springer
- Book subject: Engineering, Systems engineering, Computer science, Electronics, Semiconductor storage devices-Testing, Random access memory-Testing
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Updated: 84 days ago
